Selecting critical patterns based on local geometrical and statistical information
Pattern selection methods have been traditionally developed with a dependency on a specific classifier. In contrast, this paper presents a method that selects critical patterns deemed to carry essential information applicable to train those types of classifiers which require spatial information of t...
| Veröffentlicht in: | IEEE transactions on pattern analysis and machine intelligence. - 1979. - 33(2011), 6 vom: 15. Juni, Seite 1189-201 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2011
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| Zugriff auf das übergeordnete Werk: | IEEE transactions on pattern analysis and machine intelligence |
| Schlagworte: | Journal Article Research Support, Non-U.S. Gov't |
| Online verfügbar |
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