Recent progress on ZnO-based metal-semiconductor field-effect transistors and their application in transparent integrated circuits

Metal-semiconductor field-effect transistors (MESFETs) are widely known from opaque high-speed GaAs or high-power SiC and GaN technology. For the emerging field of transparent electronics, only metal-insulator-semiconductor field-effect transistors (MISFETs) were considered so far. This article revi...

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Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 22(2010), 47 vom: 14. Dez., Seite 5332-49
1. Verfasser: Frenzel, Heiko (VerfasserIn)
Weitere Verfasser: Lajn, Alexander, von Wenckstern, Holger, Lorenz, Michael, Schein, Friedrich, Zhang, Zhipeng, Grundmann, Marius
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2010
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Review Arsenicals Carbon Compounds, Inorganic Silicon Compounds gallium nitride 1R9CC3P9VL gallium arsenide 27FC46GA44 mehr... Gallium CH46OC8YV4 Aluminum Oxide LMI26O6933 Zinc Oxide SOI2LOH54Z silicon carbide WXQ6E537EW
Beschreibung
Zusammenfassung:Metal-semiconductor field-effect transistors (MESFETs) are widely known from opaque high-speed GaAs or high-power SiC and GaN technology. For the emerging field of transparent electronics, only metal-insulator-semiconductor field-effect transistors (MISFETs) were considered so far. This article reviews the progress of high-performance MESFETs in oxide electronics and reflects the recent advances of this technique towards transparent MESFET circuitry. We discuss design prospects as well as limitations regarding device performance, reliability and stability. The presented ZnO-based MESFETs and inverters have superior properties compared to MISFETs, i.e., high channel mobilities and on/off-ratios, high gain, and low uncertainty level at comparatively low operating voltages. This makes them a promising approach for future low-cost transparent electronics
Beschreibung:Date Completed 28.03.2011
Date Revised 30.09.2020
published: Print
Citation Status MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.201001375