Detecting the presence of denatured human serum albumin in an adsorbed protein monolayer using TOF-SIMS
We demonstrate the application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) in conjunction with multivariate statistics to differentiate trace levels of denatured proteins in adsorbed monolayers; specifically, human serum albumin (HSA) on oxidized silicon substrates. Subtle differenc...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 26(2010), 14 vom: 20. Juli, Seite 12075-80
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| 1. Verfasser: |
Kempson, Ivan M
(VerfasserIn) |
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| Weitere Verfasser: |
Martin, Amanda L,
Denman, John A,
French, Peter W,
Prestidge, Clive A,
Barnes, Timothy J |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2010
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article
Serum Albumin
Silicon
Z4152N8IUI |
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