Ultrafast imaging and the phase problem for inelastic X-ray scattering
A new method for imaging ultrafast dynamics in condensed matter using inelastic X-ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or "phase problem") for IXS is illustrated, which enables direct im...
| Veröffentlicht in: | Advanced materials (Deerfield Beach, Fla.). - 1998. - 22(2010), 10 vom: 12. März, Seite 1141-7 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , , , , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2010
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| Zugriff auf das übergeordnete Werk: | Advanced materials (Deerfield Beach, Fla.) |
| Schlagworte: | News Research Support, U.S. Gov't, Non-P.H.S. |
| Zusammenfassung: | A new method for imaging ultrafast dynamics in condensed matter using inelastic X-ray scattering (IXS) is described. Using the concepts of causality and irreversibility a general solution to the inverse scattering problem (or "phase problem") for IXS is illustrated, which enables direct imaging of dynamics of the electron density with resolutions of approximately 1 attosecond (10(-18) s) in time and <1 A in space. This method is not just Fourier transformation of the IXS data, but a means to impose causality on the data and reconstruct the charge propagator. The method can also be applied to inelastic electron or neutron scattering. A general outline of phenomena that can and cannot be studied with this technique and an outlook for the future is provided |
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| Beschreibung: | Date Completed 23.06.2010 Date Revised 30.09.2020 published: Print Citation Status MEDLINE |
| ISSN: | 1521-4095 |
| DOI: | 10.1002/adma.200904098 |