Fast keypoint recognition using random ferns

While feature point recognition is a key component of modern approaches to object detection, existing approaches require computationally expensive patch preprocessing to handle perspective distortion. In this paper, we show that formulating the problem in a naive Bayesian classification framework ma...

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Détails bibliographiques

Publié dans:	IEEE transactions on pattern analysis and machine intelligence. - 1998. - 32(2010), 3 vom: 15. März, Seite 448-61
Auteur principal:	Ozuysal, Mustafa (Auteur)
Autres auteurs:	Calonder, Michael, Lepetit, Vincent, Fua, Pascal
Format:	Article en ligne
Langue:	English
Publié:	2010
Accès à la collection:	IEEE transactions on pattern analysis and machine intelligence
Sujets:	Journal Article Research Support, Non-U.S. Gov't