Concept of a spectrometer for resonant inelastic X-ray scattering with parallel detection in incoming and outgoing photon energies
A spectrometer for resonant inelastic X-ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver a full two-dimensional map of RIXS intensity in one shot with parallel detection at incoming hv(in) and outgoing hv(out) photon energies. Pr...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 17(2010), 1 vom: 19. Jan., Seite 103-6 |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2010
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Evaluation Study Journal Article |
| Zusammenfassung: | A spectrometer for resonant inelastic X-ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver a full two-dimensional map of RIXS intensity in one shot with parallel detection at incoming hv(in) and outgoing hv(out) photon energies. Preliminary ray-tracing simulations with a typical undulator beamline demonstrate a resolving power well above 11000 with both hv(in) and hv(out) near 930 eV, with a vast potential for improvement. Combining this instrument - nicknamed hv(2) spectrometer - with an X-ray free-electron laser source simplifies its technical implementation and enables efficient time-resolved RIXS experiments |
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| Beschreibung: | Date Completed 10.03.2010 Date Revised 10.12.2019 published: Print-Electronic Citation Status MEDLINE |
| ISSN: | 1600-5775 |
| DOI: | 10.1107/S0909049509051097 |