Determination of critical micelle concentration of aerosol-OT using time-of-flight secondary ion mass spectrometry fragmentation ion patterns

Aggregation patterns and fragmentation ion data from thin film preparations of the anionic surfactant sodium bis(2-ethylhexyl) sulfosuccinate (aka Aerosol-OT (AOT)) near the critical micelle concentration (CMC) in carbon tetrachloride were determined using time-of-flight secondary ion mass spectrome...

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Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1992. - 25(2009), 19 vom: 06. Okt., Seite 11244-9
1. Verfasser: Burns, Sarah A (VerfasserIn)
Weitere Verfasser: Valint, Paul L Jr, Gardella, Joseph A Jr
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2009
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article
LEADER 01000naa a22002652 4500
001 NLM191153117
003 DE-627
005 20231223190700.0
007 cr uuu---uuuuu
008 231223s2009 xx |||||o 00| ||eng c
024 7 |a 10.1021/la902343r  |2 doi 
028 5 2 |a pubmed24n0637.xml 
035 |a (DE-627)NLM191153117 
035 |a (NLM)19731949 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Burns, Sarah A  |e verfasserin  |4 aut 
245 1 0 |a Determination of critical micelle concentration of aerosol-OT using time-of-flight secondary ion mass spectrometry fragmentation ion patterns 
264 1 |c 2009 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Completed 03.12.2009 
500 |a Date Revised 30.09.2009 
500 |a published: Print 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a Aggregation patterns and fragmentation ion data from thin film preparations of the anionic surfactant sodium bis(2-ethylhexyl) sulfosuccinate (aka Aerosol-OT (AOT)) near the critical micelle concentration (CMC) in carbon tetrachloride were determined using time-of-flight secondary ion mass spectrometry (ToF-SIMS). Previous work using electrospray ionization (ESI) and matrix-assisted laser desorption/ionization (MALDI) mass spectrometry to determine the chemical structure of AOT aggregates was compared to data from ToF-SIMS results from both positive and negative ion spectra. Quasi-molecular ions were detected for AOT in the positive and negative spectra at m/z 467 and 421, respectively, corresponding to [AOT+Na]+ and [AOT-Na]-. Repeating ion patterns assigned to AOT aggregates were detected in the positive spectra from n=3 to n=13, corresponding to the repeating series [AOTn+Na]+. A similar pattern [AOTn-Na]- was observed in the negative ion spectra from n=4 to n=14. ToF-SIMS analysis was also able to detect a previously unreported fragmentation pattern in the mass region below [AOT3+Na]+ when the film was cast from a solution with AOT concentration above the CMC. This pattern is observed starting at m/z 526 and continuing until the n=3 AOT is reached at m/z 1356 in the positive spectra. The pattern of ions is assigned to structures related to the sodium and sulfate ions from the headgroups of an aggregate of AOT molecules. The formation of the low mass pattern is shown to respond only to concentrations above the CMC, and allows for a more precise determination of CMC than previously reported methods. The CMC of AOT in carbon tetrachloride is shown to be between 2.0x10(-5) and 3.0x10(-5) molar 
650 4 |a Journal Article 
700 1 |a Valint, Paul L  |c Jr  |e verfasserin  |4 aut 
700 1 |a Gardella, Joseph A  |c Jr  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Langmuir : the ACS journal of surfaces and colloids  |d 1992  |g 25(2009), 19 vom: 06. Okt., Seite 11244-9  |w (DE-627)NLM098181009  |x 1520-5827  |7 nnns 
773 1 8 |g volume:25  |g year:2009  |g number:19  |g day:06  |g month:10  |g pages:11244-9 
856 4 0 |u http://dx.doi.org/10.1021/la902343r  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_22 
912 |a GBV_ILN_350 
912 |a GBV_ILN_721 
951 |a AR 
952 |d 25  |j 2009  |e 19  |b 06  |c 10  |h 11244-9