X-ray diffractometry for the structure determination of a submicrometre single powder grain

A high-precision diffractometer has been developed for the structure analysis of a submicrometre-scale single grain of a powder sample at the SPring-8 BL40XU undulator beamline. The key design concept is the combination of a stable focused synchrotron radiation beam and the precise axis control of t...

Ausführliche Beschreibung

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 16(2009), Pt 3 vom: 25. Mai, Seite 352-7
1. Verfasser: Yasuda, Nobuhiro (VerfasserIn)
Weitere Verfasser: Murayama, Haruno, Fukuyama, Yoshimitsu, Kim, Jungeun, Kimura, Shigeru, Toriumi, Koshiro, Tanaka, Yoshihito, Moritomo, Yutaka, Kuroiwa, Yoshihiro, Kato, Kenichi, Tanaka, Hitoshi, Takata, Masaki
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2009
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Evaluation Study Journal Article Research Support, Non-U.S. Gov't Powders
Beschreibung
Zusammenfassung:A high-precision diffractometer has been developed for the structure analysis of a submicrometre-scale single grain of a powder sample at the SPring-8 BL40XU undulator beamline. The key design concept is the combination of a stable focused synchrotron radiation beam and the precise axis control of the diffractometer, which allows accurate diffraction intensity data of a submicrometre-scale single powder grain to be measured. The phase zone plate was designed to create a high-flux focused synchrotron radiation beam. A low-eccentric goniometer and high-precision sample positioning stages were adopted to ensure the alignment of a micrometre-scale focused synchrotron radiation beam onto the submicrometre-scale single powder grain. In order to verify the diffractometer performance, the diffraction pattern data of several powder grains of BaTiO(3), of dimensions approximately 600 x 600 x 300 nm, were measured. By identifying the diffraction data set of one single powder grain, the crystal structure was successfully determined with a reliable factor of 5.24%
Beschreibung:Date Completed 09.07.2009
Date Revised 20.10.2021
published: Print-Electronic
Citation Status MEDLINE
ISSN:1600-5775
DOI:10.1107/S090904950900675X