X-ray diffractometry for the structure determination of a submicrometre single powder grain

A high-precision diffractometer has been developed for the structure analysis of a submicrometre-scale single grain of a powder sample at the SPring-8 BL40XU undulator beamline. The key design concept is the combination of a stable focused synchrotron radiation beam and the precise axis control of t...

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Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 16(2009), Pt 3 vom: 25. Mai, Seite 352-7
1. Verfasser: Yasuda, Nobuhiro (VerfasserIn)
Weitere Verfasser: Murayama, Haruno, Fukuyama, Yoshimitsu, Kim, Jungeun, Kimura, Shigeru, Toriumi, Koshiro, Tanaka, Yoshihito, Moritomo, Yutaka, Kuroiwa, Yoshihiro, Kato, Kenichi, Tanaka, Hitoshi, Takata, Masaki
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2009
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Evaluation Study Journal Article Research Support, Non-U.S. Gov't Powders