Atomic force microscopy of plant-parasitic nematodes
A simple method for atomic force microscopy (AFM) of nematode cuticle was developed to visualize the external topography of Helicotylenchus lobus, Meloidogyne javanica, M. incognita, and Xiphinema diversicaudatum. Endospores of two isolates of the nematode parasite, Pasteuria penetrans, adhering to...
| Publié dans: | Journal of nematology. - 1969. - 27(1995), 2 vom: 01. Juni, Seite 200-5 |
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| Auteur principal: | |
| Format: | Article |
| Langue: | English |
| Publié: |
1995
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| Accès à la collection: | Journal of nematology |
| Sujets: | Journal Article AFM Pasteuria penetrans atomic force microscope cuticle endospore morphology nematode scanning probe microscopy ultrastructure |