Evidence of the substrate effect in hydrogen electroinsertion into palladium atomic layers by means of in situ surface X-ray diffraction
In this work, we report an in situ surface X-ray diffraction study of the hydrogen electroinsertion in a two-monolayer equivalent palladium electrodeposit on Pt(111). The role of chloride in the deposition solution in favoring layer-by-layer film growth is evidenced. Three Pd layers are necessary to...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 25(2009), 8 vom: 21. Apr., Seite 4251-5 |
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| Weitere Verfasser: | , , , , |
| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2009
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |
| Zusammenfassung: | In this work, we report an in situ surface X-ray diffraction study of the hydrogen electroinsertion in a two-monolayer equivalent palladium electrodeposit on Pt(111). The role of chloride in the deposition solution in favoring layer-by-layer film growth is evidenced. Three Pd layers are necessary to describe the deposit structure correctly, but the third-layer occupancy is quite low, equal to about 0.22. As a major result, resistance to hydriding of the two atomic Pd layers closest to the Pt interface is observed, which is linked to a strong effect of the Pt(111) substrate. As a consequence, we observe the lowering of the total hydride stoichiometry compared to bulk Pd. Our measurements also reveal good reversibility of the deposit structure, at least toward one hydrogen insertion-desorption cycle |
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| Beschreibung: | Date Completed 07.07.2009 Date Revised 15.04.2009 published: Print Citation Status PubMed-not-MEDLINE |
| ISSN: | 1520-5827 |
| DOI: | 10.1021/la803913e |