Image contrast in X-ray reflection interface microscopy : comparison of data with model calculations and simulations

The contrast mechanism for imaging molecular-scale features on solid surfaces is described for X-ray reflection interface microscopy (XRIM) through comparison of experimental images with model calculations and simulated measurements. Images of elementary steps show that image contrast is controlled...

Description complète

Détails bibliographiques

Publié dans:	Journal of synchrotron radiation. - 1994. - 15(2008), Pt 6 vom: 11. Nov., Seite 558-71
Auteur principal:	Fenter, P (Auteur)
Autres auteurs:	Park, C, Kohli, V, Zhang, Z
Format:	Article en ligne
Langue:	English
Publié:	2008
Accès à la collection:	Journal of synchrotron radiation
Sujets:	Comparative Study Evaluation Study Journal Article Research Support, U.S. Gov't, Non-P.H.S.