APA Zitierstil

Fenter, P., Park, C., Kohli, V., & Zhang, Z. (2008). Image contrast in X-ray reflection interface microscopy: Comparison of data with model calculations and simulations. Journal of synchrotron radiation, 15(Pt 6), 558. https://doi.org/10.1107/S0909049508023935

Chicago Zitierstil

Fenter, P., C. Park, V. Kohli, und Z. Zhang. "Image Contrast in X-ray Reflection Interface Microscopy: Comparison of Data with Model Calculations and Simulations." Journal of Synchrotron Radiation 15, no. Pt 6 (2008): 558. https://dx.doi.org/10.1107/S0909049508023935.

MLA Zitierstil

Fenter, P., et al. "Image Contrast in X-ray Reflection Interface Microscopy: Comparison of Data with Model Calculations and Simulations." Journal of Synchrotron Radiation, vol. 15, no. Pt 6, 2008, p. 558.