Image contrast in X-ray reflection interface microscopy : comparison of data with model calculations and simulations
The contrast mechanism for imaging molecular-scale features on solid surfaces is described for X-ray reflection interface microscopy (XRIM) through comparison of experimental images with model calculations and simulated measurements. Images of elementary steps show that image contrast is controlled...
Ausführliche Beschreibung
Bibliographische Detailangaben
| Veröffentlicht in: | Journal of synchrotron radiation. - 1994. - 15(2008), Pt 6 vom: 11. Nov., Seite 558-71
|
|---|
| 1. Verfasser: |
Fenter, P
(VerfasserIn) |
|---|
| Weitere Verfasser: |
Park, C,
Kohli, V,
Zhang, Z |
|---|
| Format: | Online-Aufsatz
|
|---|
| Sprache: | English |
|---|
| Veröffentlicht: |
2008
|
|---|
| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation
|
|---|
| Schlagworte: | Comparative Study
Evaluation Study
Journal Article
Research Support, U.S. Gov't, Non-P.H.S. |
|---|