Model-based 2.5-d deconvolution for extended depth of field in brightfield microscopy
Due to the limited depth of field of brightfield microscopes, it is usually impossible to image thick specimens entirely in focus. By optically sectioning the specimen, the in-focus information at the specimen's surface can be acquired over a range of images. Commonly based on a high-pass crite...
| Publié dans: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society. - 1992. - 17(2008), 7 vom: 30. Juli, Seite 1144-53 |
|---|---|
| Auteur principal: | |
| Autres auteurs: | , |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2008
|
| Accès à la collection: | IEEE transactions on image processing : a publication of the IEEE Signal Processing Society |
| Sujets: | Journal Article Research Support, Non-U.S. Gov't |
| Accès en ligne |
Volltext |