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231223s2008 xx |||||o 00| ||eng c |
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7 |
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|a 10.1109/TIP.2008.924393
|2 doi
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2 |
|a pubmed25n0602.xml
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|a (DE-627)NLM180522744
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|a (NLM)18586622
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|a DE-627
|b ger
|c DE-627
|e rakwb
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| 041 |
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|a eng
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| 100 |
1 |
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|a Aguet, François
|e verfasserin
|4 aut
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| 245 |
1 |
0 |
|a Model-based 2.5-d deconvolution for extended depth of field in brightfield microscopy
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| 264 |
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1 |
|c 2008
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| 336 |
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|a Text
|b txt
|2 rdacontent
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| 337 |
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|a ƒaComputermedien
|b c
|2 rdamedia
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| 338 |
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|a ƒa Online-Ressource
|b cr
|2 rdacarrier
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| 500 |
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|a Date Completed 04.08.2008
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| 500 |
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|a Date Revised 30.06.2008
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|a published: Print
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|a Citation Status MEDLINE
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| 520 |
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|a Due to the limited depth of field of brightfield microscopes, it is usually impossible to image thick specimens entirely in focus. By optically sectioning the specimen, the in-focus information at the specimen's surface can be acquired over a range of images. Commonly based on a high-pass criterion, extended-depth-of-field methods aim at combining the in-focus information from these images into a single image of the texture on the specimen's surface. The topography provided by such methods is usually limited to a map of selected in-focus pixel positions and is inherently discretized along the axial direction, which limits its use for quantitative evaluation. In this paper, we propose a method that jointly estimates the texture and topography of a specimen from a series of brightfield optical sections; it is based on an image formation model that is described by the convolution of a thick specimen model with the microscope's point spread function. The problem is stated as a least-squares minimization where the texture and topography are updated alternately. This method also acts as a deconvolution when the in-focus PSF has a blurring effect, or when the true in-focus position falls in between two optical sections. Comparisons to state-of-the-art algorithms and experimental results demonstrate the potential of the proposed approach
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| 650 |
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4 |
|a Journal Article
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| 650 |
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4 |
|a Research Support, Non-U.S. Gov't
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| 700 |
1 |
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|a Van De Ville, Dimitri
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Unser, Michael
|e verfasserin
|4 aut
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| 773 |
0 |
8 |
|i Enthalten in
|t IEEE transactions on image processing : a publication of the IEEE Signal Processing Society
|d 1992
|g 17(2008), 7 vom: 30. Juli, Seite 1144-53
|w (DE-627)NLM09821456X
|x 1941-0042
|7 nnas
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| 773 |
1 |
8 |
|g volume:17
|g year:2008
|g number:7
|g day:30
|g month:07
|g pages:1144-53
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| 856 |
4 |
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|u http://dx.doi.org/10.1109/TIP.2008.924393
|3 Volltext
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|a GBV_USEFLAG_A
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|a SYSFLAG_A
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| 912 |
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|a GBV_NLM
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|a GBV_ILN_350
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|a AR
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|d 17
|j 2008
|e 7
|b 30
|c 07
|h 1144-53
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