Effect of tip size on force measurement in atomic force microscopy

An atomic force microscope (AFM) has been used to study solvation forces at the solid-liquid interface between highly oriented pyrolytic graphite (HOPG) and the liquids octamethylcyclotetrasiloxane (OMCTS), n-hexadecane (n-C16H34), and n-dodecanol (n-C11H23CH2OH). Oscillatory solvation forces (F) ar...

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Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1992. - 24(2008), 6 vom: 18. März, Seite 2271-3
1. Verfasser: Lim, Leonard T W (VerfasserIn)
Weitere Verfasser: Wee, Andrew T S, O'Shea, Sean J
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2008
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article
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520 |a An atomic force microscope (AFM) has been used to study solvation forces at the solid-liquid interface between highly oriented pyrolytic graphite (HOPG) and the liquids octamethylcyclotetrasiloxane (OMCTS), n-hexadecane (n-C16H34), and n-dodecanol (n-C11H23CH2OH). Oscillatory solvation forces (F) are observed for various measured tip radii (Rtip=15-100 nm). It is found that the normalized force data, F/Rtip, differ between AFM tips with a clear trend of decreasing F/Rtip with increasing Rtip 
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700 1 |a O'Shea, Sean J  |e verfasserin  |4 aut 
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