Effect of tip size on force measurement in atomic force microscopy

An atomic force microscope (AFM) has been used to study solvation forces at the solid-liquid interface between highly oriented pyrolytic graphite (HOPG) and the liquids octamethylcyclotetrasiloxane (OMCTS), n-hexadecane (n-C16H34), and n-dodecanol (n-C11H23CH2OH). Oscillatory solvation forces (F) ar...

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Détails bibliographiques
Publié dans:Langmuir : the ACS journal of surfaces and colloids. - 1985. - 24(2008), 6 vom: 18. März, Seite 2271-3
Auteur principal: Lim, Leonard T W (Auteur)
Autres auteurs: Wee, Andrew T S, O'Shea, Sean J
Format: Article en ligne
Langue:English
Publié: 2008
Accès à la collection:Langmuir : the ACS journal of surfaces and colloids
Sujets:Journal Article
Description
Résumé:An atomic force microscope (AFM) has been used to study solvation forces at the solid-liquid interface between highly oriented pyrolytic graphite (HOPG) and the liquids octamethylcyclotetrasiloxane (OMCTS), n-hexadecane (n-C16H34), and n-dodecanol (n-C11H23CH2OH). Oscillatory solvation forces (F) are observed for various measured tip radii (Rtip=15-100 nm). It is found that the normalized force data, F/Rtip, differ between AFM tips with a clear trend of decreasing F/Rtip with increasing Rtip
Description:Date Completed 14.05.2008
Date Revised 11.03.2008
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1520-5827
DOI:10.1021/la703231h