New SFA techniques for studying surface forces and thin film patterns induced by electric fields
We describe two ways to measure normal and/or lateral forces between two surfaces in a surface forces apparatus (SFA) while an electric field is applied between the surfaces. The first method involves depositing thin conductive layers on the exposed substrate (usually mica) sheets; the second involv...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 24(2008), 4 vom: 19. Feb., Seite 1173-82 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2008
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Journal Article |