Advanced fabrication and characterization of epitaxial ferroelectric thin films and multilayers

Understanding the behavior of ferroelectrics on the nanoscale level requires the production of materials of the highest quality and advanced characterization techniques for probing the fascinating properties of these systems with reduced dimensions. Here we give an overview of our recent achievement...

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Détails bibliographiques
Publié dans:IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 53(2006), 12 vom: 11. Dez., Seite 2261-9
Auteur principal: Dawber, Matthew (Auteur)
Autres auteurs: Lichtensteiger, Céline, Paruch, Patrycja, Triscone, Jean-Marc
Format: Article
Langue:English
Publié: 2006
Accès à la collection:IEEE transactions on ultrasonics, ferroelectrics, and frequency control
Sujets:Journal Article Research Support, Non-U.S. Gov't Membranes, Artificial