Advanced fabrication and characterization of epitaxial ferroelectric thin films and multilayers

Understanding the behavior of ferroelectrics on the nanoscale level requires the production of materials of the highest quality and advanced characterization techniques for probing the fascinating properties of these systems with reduced dimensions. Here we give an overview of our recent achievement...

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Bibliographische Detailangaben
Veröffentlicht in:IEEE transactions on ultrasonics, ferroelectrics, and frequency control. - 1986. - 53(2006), 12 vom: 11. Dez., Seite 2261-9
1. Verfasser: Dawber, Matthew (VerfasserIn)
Weitere Verfasser: Lichtensteiger, Céline, Paruch, Patrycja, Triscone, Jean-Marc
Format: Aufsatz
Sprache:English
Veröffentlicht: 2006
Zugriff auf das übergeordnete Werk:IEEE transactions on ultrasonics, ferroelectrics, and frequency control
Schlagworte:Journal Article Research Support, Non-U.S. Gov't Membranes, Artificial
LEADER 01000caa a22002652c 4500
001 NLM167359126
003 DE-627
005 20250207214224.0
007 tu
008 231223s2006 xx ||||| 00| ||eng c
028 5 2 |a pubmed25n0558.xml 
035 |a (DE-627)NLM167359126 
035 |a (NLM)17186905 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Dawber, Matthew  |e verfasserin  |4 aut 
245 1 0 |a Advanced fabrication and characterization of epitaxial ferroelectric thin films and multilayers 
264 1 |c 2006 
336 |a Text  |b txt  |2 rdacontent 
337 |a ohne Hilfsmittel zu benutzen  |b n  |2 rdamedia 
338 |a Band  |b nc  |2 rdacarrier 
500 |a Date Completed 30.01.2007 
500 |a Date Revised 17.09.2019 
500 |a published: Print 
500 |a Citation Status MEDLINE 
520 |a Understanding the behavior of ferroelectrics on the nanoscale level requires the production of materials of the highest quality and advanced characterization techniques for probing the fascinating properties of these systems with reduced dimensions. Here we give an overview of our recent achievements in this area, which includes the detailed study of the suppression of ferroelectricity in PbTiO3 thin films, the fabrication of PbTiO3/SrTiO3 superlattices in which ferroelectricity shows some surprising behavior, and finally the manipulation of nanoscale ferroelectric domains using the atomic force microscope which leads to the precise analysis of domain wall creep and roughness in Pb(Zr,Ti)O3 thin films 
650 4 |a Journal Article 
650 4 |a Research Support, Non-U.S. Gov't 
650 7 |a Membranes, Artificial  |2 NLM 
700 1 |a Lichtensteiger, Céline  |e verfasserin  |4 aut 
700 1 |a Paruch, Patrycja  |e verfasserin  |4 aut 
700 1 |a Triscone, Jean-Marc  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t IEEE transactions on ultrasonics, ferroelectrics, and frequency control  |d 1986  |g 53(2006), 12 vom: 11. Dez., Seite 2261-9  |w (DE-627)NLM098181017  |x 1525-8955  |7 nnas 
773 1 8 |g volume:53  |g year:2006  |g number:12  |g day:11  |g month:12  |g pages:2261-9 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_22 
912 |a GBV_ILN_24 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 53  |j 2006  |e 12  |b 11  |c 12  |h 2261-9