Ellipsometric search for vapor layers at liquid-hydrophobic solid surfaces
We use precision ellipsometry to evaluate the existence of nanometer thick vapor films at the surface between a liquid and a hydrophobic alkylsilane coated Si wafer. We find no evidence for such vapor films. All of our fluid-solid ellipsometry measurements can be explained using a double layer model...
| Publié dans: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 22(2006), 4 vom: 14. Feb., Seite 1715-21 |
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| Auteur principal: | |
| Autres auteurs: | , , |
| Format: | Article |
| Langue: | English |
| Publié: |
2006
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| Accès à la collection: | Langmuir : the ACS journal of surfaces and colloids |
| Sujets: | Journal Article |