Direct imaging of meniscus formation in atomic force microscopy using environmental scanning electron microscopy
Environmental scanning electron microscopy was used to image meniscus formation between an AFM tip and a surface. At high relative humidity, 70%-99%, the meniscus formed is 100 to 1200 nm in height, orders of magnitude larger than predicted by the Kelvin equation using spherical geometry. The height...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 21(2005), 18 vom: 30. Aug., Seite 8096-8 |
|---|---|
| 1. Verfasser: | |
| Weitere Verfasser: | , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2005
|
| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Letter |
| Zusammenfassung: | Environmental scanning electron microscopy was used to image meniscus formation between an AFM tip and a surface. At high relative humidity, 70%-99%, the meniscus formed is 100 to 1200 nm in height, orders of magnitude larger than predicted by the Kelvin equation using spherical geometry. The height of the meniscus also demonstrates hysteresis associated with increasing or decreasing relative humidity |
|---|---|
| Beschreibung: | Date Completed 20.03.2007 Date Revised 23.08.2005 published: Print Citation Status PubMed-not-MEDLINE |
| ISSN: | 1520-5827 |