Direct imaging of meniscus formation in atomic force microscopy using environmental scanning electron microscopy
Environmental scanning electron microscopy was used to image meniscus formation between an AFM tip and a surface. At high relative humidity, 70%-99%, the meniscus formed is 100 to 1200 nm in height, orders of magnitude larger than predicted by the Kelvin equation using spherical geometry. The height...
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1992. - 21(2005), 18 vom: 30. Aug., Seite 8096-8 |
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| Weitere Verfasser: | , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2005
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids |
| Schlagworte: | Letter |