Stamp collapse in soft lithography

We have studied the so-called roof collapse in soft lithography. Roof collapse is due to the adhesion between the PDMS stamp and substrate, and it may affect the quality of soft lithography. Our analysis accounts for the interactions of multiple punches and the effect of elastic mismatch between the...

Ausführliche Beschreibung

Bibliographische Detailangaben
Veröffentlicht in:Langmuir : the ACS journal of surfaces and colloids. - 1985. - 21(2005), 17 vom: 16. Aug., Seite 8058-68
1. Verfasser: Huang, Yonggang Y (VerfasserIn)
Weitere Verfasser: Zhou, Weixing, Hsia, K J, Menard, Etienne, Park, Jang-Ung, Rogers, John A, Alleyne, Andrew G
Format: Aufsatz
Sprache:English
Veröffentlicht: 2005
Zugriff auf das übergeordnete Werk:Langmuir : the ACS journal of surfaces and colloids
Schlagworte:Journal Article
Beschreibung
Zusammenfassung:We have studied the so-called roof collapse in soft lithography. Roof collapse is due to the adhesion between the PDMS stamp and substrate, and it may affect the quality of soft lithography. Our analysis accounts for the interactions of multiple punches and the effect of elastic mismatch between the PDMS stamp and substrate. A scaling law among the stamp modulus, punch height and spacing, and work of adhesion between the stamp and substrate is established. Such a scaling law leads to a simple criterion against the unwanted roof collapse. The present study agrees well with the experimental data
Beschreibung:Date Completed 03.04.2007
Date Revised 10.08.2005
published: Print
Citation Status PubMed-not-MEDLINE
ISSN:1520-5827