An X-ray nanodiffraction technique for structural characterization of individual nanomaterials
An X-ray micro/nanodiffraction technique that allows structural characterization of individual nanomaterials has been developed at an insertion-device beamline of the Advanced Photon Source. Using the extremely high brightness of the third-generation synchrotron radiation source and advanced high-re...
| Publié dans: | Journal of synchrotron radiation. - 1994. - 12(2005), Pt 2 vom: 23. März, Seite 124-8 |
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| Auteur principal: | |
| Autres auteurs: | , , , |
| Format: | Article |
| Langue: | English |
| Publié: |
2005
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| Accès à la collection: | Journal of synchrotron radiation |
| Sujets: | Journal Article |