An X-ray nanodiffraction technique for structural characterization of individual nanomaterials
An X-ray micro/nanodiffraction technique that allows structural characterization of individual nanomaterials has been developed at an insertion-device beamline of the Advanced Photon Source. Using the extremely high brightness of the third-generation synchrotron radiation source and advanced high-re...
| Publié dans: | Journal of synchrotron radiation. - 1994. - 12(2005), Pt 2 vom: 23. März, Seite 124-8 |
|---|---|
| Auteur principal: | |
| Autres auteurs: | , , , |
| Format: | Article |
| Langue: | English |
| Publié: |
2005
|
| Accès à la collection: | Journal of synchrotron radiation |
| Sujets: | Journal Article |
| Résumé: | An X-ray micro/nanodiffraction technique that allows structural characterization of individual nanomaterials has been developed at an insertion-device beamline of the Advanced Photon Source. Using the extremely high brightness of the third-generation synchrotron radiation source and advanced high-resolution high-energy zone-plate focusing optics, X-rays of energies from 6 to 12 keV have been focused into a spot smaller than 200 nm with a photon density gain of more than 50,000 so that significant photon flux can be intercepted by a nanoscale material to generate a measurable diffraction signal for structural characterization. This paper describes the instrumentation of the technique and discusses the application of the technique to studies of tin oxide nanobelts |
|---|---|
| Description: | Date Completed 20.04.2005 Date Revised 24.02.2005 published: Print-Electronic Citation Status PubMed-not-MEDLINE |
| ISSN: | 1600-5775 |