A focusing crystal analyser for the rejection of inelastic X-ray scattering
A focusing crystal analyser has been constructed that allows the rejection of inelastic X-ray scattering during diffuse scattering measurements close to an absorption edge. A Johann geometry was obtained by cylindrical bending of perfect silicon and germanium crystals. The choice of reflection, the...
| Veröffentlicht in: | Journal of synchrotron radiation. - 1999. - 10(2003), Pt 3 vom: 01. Mai, Seite 255-9 |
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| 1. Verfasser: | |
| Weitere Verfasser: | , , |
| Format: | Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2003
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| Zugriff auf das übergeordnete Werk: | Journal of synchrotron radiation |
| Schlagworte: | Journal Article |