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|a pubmed24n0399.xml
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|a (DE-627)NLM119636174
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|a (NLM)12091730
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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|a Souvorov, A
|e verfasserin
|4 aut
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|a Deterministic retrieval of surface waviness by means of topography with coherent X-rays
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|c 2002
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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|a Band
|b nc
|2 rdacarrier
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|a Date Completed 28.10.2002
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|a Date Revised 05.06.2019
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a A surface profile retrieval technique from multiple X-ray total reflection images taken at various distances with full coherent illumination is demonstrated. An experiment was performed using the 1 km-long BL29XU beamline at the SPring-8 facility, Japan. Obtained results are compared with results from the optical metrology technique (Fizeau's interferometer). Good agreement between X-ray and optical methods proves the validity of the current approach. Meanwhile, the sensitivity of the X-ray technique is several times higher than that of the standard one. This technique is well suited to the needs of characterizing grazing optics for new-generation X-ray sources
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|a Journal Article
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|a Yabashi, M
|e verfasserin
|4 aut
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|a Tamasaku, K
|e verfasserin
|4 aut
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|a Ishikawa, T
|e verfasserin
|4 aut
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|a Mori, Y
|e verfasserin
|4 aut
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|a Yamauchi, K
|e verfasserin
|4 aut
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|a Yamamura, K
|e verfasserin
|4 aut
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|a Saito, A
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 9(2002), Pt 4 vom: 01. Juli, Seite 223-8
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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|g volume:9
|g year:2002
|g number:Pt 4
|g day:01
|g month:07
|g pages:223-8
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|a SYSFLAG_A
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|a GBV_ILN_40
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|a GBV_ILN_350
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|a GBV_ILN_2005
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|a AR
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|d 9
|j 2002
|e Pt 4
|b 01
|c 07
|h 223-8
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