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231222s1999 xx ||||| 00| ||eng c |
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|a pubmed25n0395.xml
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|a (DE-627)NLM118495119
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|a (NLM)11970373
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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| 100 |
1 |
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|a de Urquijo, J
|e verfasserin
|4 aut
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|a Ionization, electron attachment, and drift in CHF3
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|c 1999
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|a Text
|b txt
|2 rdacontent
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|a ohne Hilfsmittel zu benutzen
|b n
|2 rdamedia
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|a Band
|b nc
|2 rdacarrier
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| 500 |
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|a Date Completed 16.07.2002
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|a Date Revised 28.07.2019
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|a published: Print
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|a Citation Status PubMed-not-MEDLINE
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|a Using a pulsed Townsend technique, we have measured the effective ionization coefficient and the electron drift velocities in CHF(3). The density-normalized electric field intensity E/N ranged from 4 to 250 townsends (Td) (1 Td=10(-17) V cm(2)). The E/N value at which the effective ionization coefficient becomes zero was estimated to be 66 Td. For E/N<20 Td, the electron attachment coefficients are practically constant, and are compatible to within about +/-70% with previously measured values at thermal energies and above
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|a Journal Article
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1 |
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|a Alvarez, I
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Cisneros, C
|e verfasserin
|4 aut
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| 773 |
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|i Enthalten in
|t Physical review. E, Statistical physics, plasmas, fluids, and related interdisciplinary topics
|d 1993
|g 60(1999), 4 Pt B vom: 30. Okt., Seite 4990-2
|w (DE-627)NLM098226002
|x 1063-651X
|7 nnns
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| 773 |
1 |
8 |
|g volume:60
|g year:1999
|g number:4 Pt B
|g day:30
|g month:10
|g pages:4990-2
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|a GBV_USEFLAG_A
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|a GBV_NLM
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|a GBV_ILN_350
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|a AR
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|d 60
|j 1999
|e 4 Pt B
|b 30
|c 10
|h 4990-2
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