Glancing-angle diffraction anomalous fine structure of InAs quantum dots and quantum wires

We have performed Diffraction Anomalous Fine Structure measurements at the As K-edge of self-growth InAs/InP(001) Quantum Wires and InAs/GaAs(001) Quantum Dots. The samples have been grown by Molecular Beam Epitaxy and their equivalent thickness is of 2.5 monolayers. We have measured the (440) and (...

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Publié dans:	Journal of synchrotron radiation. - 1999. - 8(2001), Pt 2 vom: 01. März, Seite 536-8
Auteur principal:	Grenier, S (Auteur)
Autres auteurs:	Proietti, M G, Renevier, H, Gonzalez, L, García, J M, Gérard, J M, García, J
Format:	Article
Langue:	English
Publié:	2001
Accès à la collection:	Journal of synchrotron radiation
Sujets:	Journal Article