$Glancing-angle diffraction anomalous fine structure of InAs quantum dots and quantum wires$

Glancing-angle diffraction anomalous fine structure of InAs quantum dots and quantum wires

We have performed Diffraction Anomalous Fine Structure measurements at the As K-edge of self-growth InAs/InP(001) Quantum Wires and InAs/GaAs(001) Quantum Dots. The samples have been grown by Molecular Beam Epitaxy and their equivalent thickness is of 2.5 monolayers. We have measured the (440) and (...

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Bibliographische Detailangaben
Veröffentlicht in:	Journal of synchrotron radiation. - 1999. - 8(2001), Pt 2 vom: 01. März, Seite 536-8
1. Verfasser:	Grenier, S (VerfasserIn)
Weitere Verfasser:	Proietti, M G, Renevier, H, Gonzalez, L, García, J M, Gérard, J M, García, J
Format:	Aufsatz
Sprache:	English
Veröffentlicht:	2001
Zugriff auf das übergeordnete Werk:	Journal of synchrotron radiation
Schlagworte:	Journal Article