A look inside epitaxial cobalt-on-fluorite nanoparticles with three-dimensional reciprocal space mapping using GIXD, RHEED and GISAXS

par Suturin, S M
Publié dans: Journal of applied crystallography (2013)

Lowest limit for detection of impurity concentration in semiconductors by fluorescence XAFS resonant Raman scattering and angle dependence

par Takeda, Y
Publié dans: Journal of synchrotron radiation (2005)

Collection of reciprocal space maps using imaging plates at the Australian National Beamline Facility at the Photon Factory

par Mudie, S T
Publié dans: Journal of synchrotron radiation (2004)

XAFS study of LiCo1-xFexO2 cathode for rechargeable lithium battery by laboratory XAFS spectrometer

par Kageyama, H
Publié dans: Journal of synchrotron radiation (2001)

Observation of composition in surface monolayers by X-ray scattering spectra caused by crystal truncation and interferences

par Tabuchi, M
Publié dans: Journal of synchrotron radiation (1998)

Local structure study of dilute Er in III-V semiconductors by fluorescence EXAFS

par Ofuchi, H
Publié dans: Journal of synchrotron radiation (1998)