Measurement of barrier tissue integrity with an organic electrochemical transistor

par Jimison, Leslie H
Publié dans: Advanced materials (Deerfield Beach, Fla.) (2012)

Quantification of thin film crystallographic orientation using X-ray diffraction with an area detector

par Baker, Jessy L
Publié dans: Langmuir : the ACS journal of surfaces and colloids (2010)

Microstructural origin of high mobility in high-performance poly(thieno-thiophene) thin-film transistors

par Wang, Chenchen
Publié dans: Advanced materials (Deerfield Beach, Fla.) (2010)