The use of atomic force microscopy (AFM) for nanoscale surface characterization and mechanical property measurement has attracted considerable interest. At the level of single-molecule mechanical measurement, AFM is a powerful tool for both surface morphology analysis and mechanical assessment. Howe...
Bibliographische Detailangaben
| Veröffentlicht in: | Langmuir : the ACS journal of surfaces and colloids. - 1985. - 41(2025), 38 vom: 30. Sept., Seite 26342-26353
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| 1. Verfasser: |
Tian, Liguo
(VerfasserIn) |
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| Weitere Verfasser: |
He, Yongkun,
Wang, Yang,
Yu, Haiyue,
Yu, Wentao,
Wang, Baichuan,
Liu, Lanjiao,
Zhang, Wenxiao,
Wang, Ying,
Zhang, Xiao,
Hu, Cuihua,
Ji, Wei,
Wang, Zuobin |
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| Format: | Online-Aufsatz
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| Sprache: | English |
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| Veröffentlicht: |
2025
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| Zugriff auf das übergeordnete Werk: | Langmuir : the ACS journal of surfaces and colloids
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| Schlagworte: | Journal Article |
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