Anomalous Phase Change in SbSex Memristors for Ultrafast Image Encryption

© 2025 Wiley‐VCH GmbH.

Détails bibliographiques
Publié dans:Advanced materials (Deerfield Beach, Fla.). - 1998. - 37(2025), 42 vom: 01. Okt., Seite e08107
Auteur principal: Zhou, Guangdong (Auteur)
Autres auteurs: Gu, Dengshun, Ye, Jin, Sun, Bai, Shi, Hang, Ran, Haofeng, Ji'e, Musha, Hu, Xiaofang, Wang, Lidan, Duan, Shukai, Ling, Haifeng
Format: Article en ligne
Langue:English
Publié: 2025
Accès à la collection:Advanced materials (Deerfield Beach, Fla.)
Sujets:Journal Article Joule heat image encryption memristor negative differential resistance phase change
Description
Résumé:© 2025 Wiley‐VCH GmbH.
Complex electrical nonlinearity process in neurons is believed to be the origin of high-level cognition, highly desired for an electronic device with rich dynamics. Here, an anomalous phase transition in the semiconducting SbSex thin film is observed in situ, which includes not only the conventional phase transition process (amorphous to crystalline) but also involves the Sb metallic nucleus growth that has never been observed before. Theoretical simulation results show that when Sb or Se vacancies are introduced into the SbSex, Joule heat will accumulate near the vacancy centers, causing an anomalous phase transition in a localized region, thereby giving the defective memristor a unique N-shape negative differential resistance (NDR) effect. These rich nonlinear electric switching dynamics provide a chaotic system for ultra-fast image encryption that is at least two orders of magnitude faster than current techniques. This work builds a novel theory horizon as well as extends brand-new application area of phase change electronics
Description:Date Revised 23.10.2025
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1521-4095
DOI:10.1002/adma.202508107