Cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer : performance tests and a comparison with spherically bent Bragg analyzers

open access.

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 32(2025), Pt 1 vom: 01. Jan., Seite 109-117
1. Verfasser: Hiraoka, Nozomu (VerfasserIn)
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2025
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article Laue analyzers X-ray Raman scattering X-ray emission spectroscopy cylindrically bent Laue analyzers spherically bent Bragg analyzers
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520 |a The performances of a spherically bent Bragg analyzer and a cylindrically bent Laue analyzer in an X-ray Raman/emission spectrometer are compared. The reflectivity and energy resolution are evaluated from the intensity of the elastic scattering and the width of the energy distribution on a SiO2 glass sample. Widely used, Bragg analyzers display excellent performance at the photon energy E ≤ 10 keV. However, at higher E, the reflectivity and the resolution gradually deteriorate as E increases, showing poor performance above 20 keV. On the other hand, the reflectivity of the Laue analyzer gradually increases at E > 10 keV, displaying excellent reflectivity and good resolution around 20 keV. The Laue analyzer is suitable for X-ray absorption spectroscopy in high-energy-resolution fluorescence-detection mode or X-ray emission spectroscopy on 4d transition metal compounds. Furthermore, the X-ray Raman features of the lithium K-edge in LiF and the oxygen K-edge feature in H2O, measured by nine Bragg analyzers (2 m radius) at E ≃ 9.9 keV and by five Laue analyzers (1.4 m radius) at E ≃ 19.5 keV, have been compared. Similar count rates and resolutions are observed 
650 4 |a Journal Article 
650 4 |a Laue analyzers 
650 4 |a X-ray Raman scattering 
650 4 |a X-ray emission spectroscopy 
650 4 |a cylindrically bent Laue analyzers 
650 4 |a spherically bent Bragg analyzers 
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