Zhang, L., Raza, M. H., Wu, R., Gruel, K., Dubourdieu, C., Hÿtch, M., & Gatel, C. (2025). Quantification of Interfacial Charges in Multilayered Nanocapacitors by Operando Electron Holography. Advanced materials (Deerfield Beach, Fla.), 37(4), . https://doi.org/10.1002/adma.202413691
Style de citation ChicagoZhang, Leifeng, Muhammad Hamid Raza, Rong Wu, Kilian Gruel, Catherine Dubourdieu, Martin Hÿtch, et Christophe Gatel. "Quantification of Interfacial Charges in Multilayered Nanocapacitors by Operando Electron Holography." Advanced Materials (Deerfield Beach, Fla.) 37, no. 4 (2025). https://dx.doi.org/10.1002/adma.202413691.
Style de citation MLAZhang, Leifeng, et al. "Quantification of Interfacial Charges in Multilayered Nanocapacitors by Operando Electron Holography." Advanced Materials (Deerfield Beach, Fla.), vol. 37, no. 4, 2025.