Meng, K., Zheng, R., Gu, X., Zhang, R., Guo, L., Qin, Y., . . . Sun, X. (2025). In-Device Ballistic-Electron-Emission Spectroscopy for Accurately In Situ Mapping Energy Level Alignment at Metal-Organic Semiconductors Interface. Advanced materials (Deerfield Beach, Fla.), 37(1), . https://doi.org/10.1002/adma.202412758
Style de citation ChicagoMeng, Ke, et al. "In-Device Ballistic-Electron-Emission Spectroscopy for Accurately In Situ Mapping Energy Level Alignment at Metal-Organic Semiconductors Interface." Advanced Materials (Deerfield Beach, Fla.) 37, no. 1 (2025). https://dx.doi.org/10.1002/adma.202412758.
Style de citation MLAMeng, Ke, et al. "In-Device Ballistic-Electron-Emission Spectroscopy for Accurately In Situ Mapping Energy Level Alignment at Metal-Organic Semiconductors Interface." Advanced Materials (Deerfield Beach, Fla.), vol. 37, no. 1, 2025.