Atom Probe Tomography : a Local Probe for Chemical Bonds in Solids

© 2024 The Author(s). Advanced Materials published by Wiley‐VCH GmbH.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - (2024) vom: 09. Nov., Seite e2403046
1. Verfasser: Cojocaru-Mirédin, Oana (VerfasserIn)
Weitere Verfasser: Yu, Yuan, Köttgen, Jan, Ghosh, Tanmoy, Schön, Carl-Friedrich, Han, Shuai, Zhou, Chongjian, Zhu, Min, Wuttig, Matthias
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2024
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article Review atom probe tomography bond breaking chalcogenides field penetration depth metavalent bonding probability of multiple events
LEADER 01000naa a22002652 4500
001 NLM380068702
003 DE-627
005 20241115233656.0
007 cr uuu---uuuuu
008 241115s2024 xx |||||o 00| ||eng c
024 7 |a 10.1002/adma.202403046  |2 doi 
028 5 2 |a pubmed24n1601.xml 
035 |a (DE-627)NLM380068702 
035 |a (NLM)39520347 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Cojocaru-Mirédin, Oana  |e verfasserin  |4 aut 
245 1 0 |a Atom Probe Tomography  |b a Local Probe for Chemical Bonds in Solids 
264 1 |c 2024 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Revised 09.11.2024 
500 |a published: Print-Electronic 
500 |a Citation Status Publisher 
520 |a © 2024 The Author(s). Advanced Materials published by Wiley‐VCH GmbH. 
520 |a Atom probe tomography is frequently employed to characterize the elemental distribution in solids with atomic resolution. Here the potential of this technique to locally probe chemical bonds is reviewed and discussed. Two processes characterize the bond rupture in laser-assisted field emission, the probability of molecular ions (PMI), i.e., the probability that molecular ions are evaporated instead of single (atomic) ions, and the probability of multiple events (PME), i.e., the correlated field-evaporation of more than a single fragment upon laser- or voltage pulse excitation. Here it is demonstrated that one can clearly distinguish solids with metallic, covalent, and metavalent bonds based on their bond rupture, i.e., their PME and PMI values. These findings open new avenues in understanding and designing advanced materials, since they allow a quantification of bonds in solids on a nanometer scale, as will be shown for several examples. These possibilities would even justify calling the present approach bonding probe tomography (BPT) 
650 4 |a Journal Article 
650 4 |a Review 
650 4 |a atom probe tomography 
650 4 |a bond breaking 
650 4 |a chalcogenides 
650 4 |a field penetration depth 
650 4 |a metavalent bonding 
650 4 |a probability of multiple events 
700 1 |a Yu, Yuan  |e verfasserin  |4 aut 
700 1 |a Köttgen, Jan  |e verfasserin  |4 aut 
700 1 |a Ghosh, Tanmoy  |e verfasserin  |4 aut 
700 1 |a Schön, Carl-Friedrich  |e verfasserin  |4 aut 
700 1 |a Han, Shuai  |e verfasserin  |4 aut 
700 1 |a Zhou, Chongjian  |e verfasserin  |4 aut 
700 1 |a Zhu, Min  |e verfasserin  |4 aut 
700 1 |a Wuttig, Matthias  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Advanced materials (Deerfield Beach, Fla.)  |d 1998  |g (2024) vom: 09. Nov., Seite e2403046  |w (DE-627)NLM098206397  |x 1521-4095  |7 nnns 
773 1 8 |g year:2024  |g day:09  |g month:11  |g pages:e2403046 
856 4 0 |u http://dx.doi.org/10.1002/adma.202403046  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |j 2024  |b 09  |c 11  |h e2403046