Five-analyzer Johann spectrometer for hard X-ray photon-in/photon-out spectroscopy at the Inner Shell Spectroscopy beamline at NSLS-II : design, alignment and data acquisition

open access.

Détails bibliographiques
Publié dans:Journal of synchrotron radiation. - 1994. - 31(2024), Pt 6 vom: 01. Nov., Seite 1609-1621
Auteur principal: Tayal, Akhil (Auteur)
Autres auteurs: Coburn, David Scott, Abel, Donald, Rakitin, Max, Ivashkevych, Oksana, Wlodek, Jakub, Wierzbicki, Dominik, Xu, Weihe, Nazaretski, Evgeny, Stavitski, Eli, Leshchev, Denis
Format: Article en ligne
Langue:English
Publié: 2024
Accès à la collection:Journal of synchrotron radiation
Sujets:Journal Article Johann geometry X-ray emission spectrometers X-ray spectroscopy
Description
Résumé:open access.
Here, a recently commissioned five-analyzer Johann spectrometer at the Inner Shell Spectroscopy beamline (8-ID) at the National Synchrotron Light Source II (NSLS-II) is presented. Designed for hard X-ray photon-in/photon-out spectroscopy, the spectrometer achieves a resolution in the 0.5-2 eV range, depending on the element and/or emission line, providing detailed insights into the local electronic and geometric structure of materials. It serves a diverse user community, including fields such as physical, chemical, biological, environmental and materials sciences. This article details the mechanical design, alignment procedures and data-acquisition scheme of the spectrometer, with a particular focus on the continuous asynchronous data-acquisition approach that significantly enhances experimental efficiency
Description:Date Revised 09.11.2024
published: Print-Electronic
Citation Status PubMed-not-MEDLINE
ISSN:1600-5775
DOI:10.1107/S1600577524009342