Liang, Y., & Zhou, Y. (2024). Low-dose electron microscopy imaging for beam-sensitive metal-organic frameworks. Journal of applied crystallography, 57(Pt 5), 1270. https://doi.org/10.1107/S1600576724007192
Style de citation ChicagoLiang, Yuhang, et Yi Zhou. "Low-dose Electron Microscopy Imaging for Beam-sensitive Metal-organic Frameworks." Journal of Applied Crystallography 57, no. Pt 5 (2024): 1270. https://dx.doi.org/10.1107/S1600576724007192.
Style de citation MLALiang, Yuhang, et Yi Zhou. "Low-dose Electron Microscopy Imaging for Beam-sensitive Metal-organic Frameworks." Journal of Applied Crystallography, vol. 57, no. Pt 5, 2024, p. 1270.
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