Electronic angle focusing for neutron time-of-flight powder diffractometers
© Robert B. Von Dreele 2024.
| Publié dans: | Journal of applied crystallography. - 1998. - 57(2024), Pt 5 vom: 01. Okt., Seite 1588-1597 |
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| Auteur principal: | |
| Format: | Article en ligne |
| Langue: | English |
| Publié: |
2024
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| Accès à la collection: | Journal of applied crystallography |
| Sujets: | Journal Article electronic focusing neutron powder diffraction profile shape functions time of flight |
| Résumé: | © Robert B. Von Dreele 2024. A neutron time-of-flight (TOF) powder diffractometer with a continuous wide-angle array of detectors can be electronically focused to make a single pseudo-constant wavelength diffraction pattern, thus facilitating angle-dependent intensity corrections. The resulting powder diffraction peak profiles are affected by the neutron source emission profile and resemble the function currently used for TOF diffraction |
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| Description: | Date Revised 11.10.2024 published: Electronic-eCollection Citation Status PubMed-not-MEDLINE |
| ISSN: | 0021-8898 |
| DOI: | 10.1107/S1600576724008756 |