Depth-Resolved X-Ray Photoelectron Spectroscopy Evidence of Intrinsic Polar States in HfO2-Based Ferroelectrics

© 2024 The Author(s). Advanced Materials published by Wiley‐VCH GmbH.

Détails bibliographiques
Publié dans:Advanced materials (Deerfield Beach, Fla.). - 1998. - 36(2024), 45 vom: 05. Nov., Seite e2408572
Auteur principal: Hill, Megan O (Auteur)
Autres auteurs: Kim, Ji Soo, Müller, Moritz L, Phuyal, Dibya, Taper, Sunil, Bansal, Manisha, Becker, Maximilian T, Bakhit, Babak, Maity, Tuhin, Monserrat, Bartomeu, Martino, Giuliana Di, Strkalj, Nives, MacManus-Driscoll, Judith L
Format: Article en ligne
Langue:English
Publié: 2024
Accès à la collection:Advanced materials (Deerfield Beach, Fla.)
Sujets:Journal Article electrochemistry ferroelectricity hafnia x‐ray photoelectron spectroscopy