Development of an X-ray ionization beam position monitor for PAL-XFEL soft X-rays

open access.

Bibliographische Detailangaben
Veröffentlicht in:Journal of synchrotron radiation. - 1994. - 31(2024), Pt 5 vom: 01. Sept., Seite 1019-1028
1. Verfasser: Kim, Seonghan (VerfasserIn)
Weitere Verfasser: Hwang, SunMin, Jang, Hoyoung, Lee, Seungcheol, Hyun, HyoJung
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2024
Zugriff auf das übergeordnete Werk:Journal of synchrotron radiation
Schlagworte:Journal Article X-ray free-electron laser beam position monitoring in situ diagnostics ionization soft X-rays
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520 |a The Pohang Accelerator Laboratory X-ray Free-Electron Laser (PAL-XFEL) operates hard X-ray and soft X-ray beamlines for conducting scientific experiments providing intense ultrashort X-ray pulses based on the self-amplified spontaneous emission (SASE) process. The X-ray free-electron laser is characterized by strong pulse-to-pulse fluctuations resulting from the SASE process. Therefore, online photon diagnostics are very important for rigorous measurements. The concept of photo-absorption and emission using solid materials is seldom considered in soft X-ray beamline diagnostics. Instead, gas monitoring detectors, which utilize the photo-ionization of noble gas, are employed for monitoring the beam intensity. To track the beam position at the soft X-ray beamline in addition to those intensity monitors, an X-ray ionization beam position monitor (XIBPM) has been developed and characterized at the soft X-ray beamline of PAL-XFEL. The XIBPM utilizes ionization of either the residual gas in an ultra-high-vacuum environment or injected krypton gas, along with a microchannel plate with phosphor. The XIBPM was tested separately for monitoring horizontal and vertical beam positions, confirming the feasibility of tracking relative changes in beam position both on average and down to single-shot measurements. This paper presents the basic structure and test results of the newly developed non-invasive XIBPM 
650 4 |a Journal Article 
650 4 |a X-ray free-electron laser 
650 4 |a beam position monitoring 
650 4 |a in situ diagnostics 
650 4 |a ionization 
650 4 |a soft X-rays 
700 1 |a Hwang, SunMin  |e verfasserin  |4 aut 
700 1 |a Jang, Hoyoung  |e verfasserin  |4 aut 
700 1 |a Lee, Seungcheol  |e verfasserin  |4 aut 
700 1 |a Hyun, HyoJung  |e verfasserin  |4 aut 
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