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|a 10.1107/S1600577524002406
|2 doi
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|a (NLM)38619289
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|a DE-627
|b ger
|c DE-627
|e rakwb
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|a eng
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|a Hagiwara, Kenta
|e verfasserin
|4 aut
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|a Development of dual-beamline photoelectron momentum microscopy for valence orbital analysis
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|c 2024
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
|b c
|2 rdamedia
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|a ƒa Online-Ressource
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|2 rdacarrier
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|a Date Revised 09.05.2024
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|a published: Print-Electronic
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|a Citation Status PubMed-not-MEDLINE
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|a open access.
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|a The soft X-ray photoelectron momentum microscopy (PMM) experimental station at the UVSOR Synchrotron Facility has been recently upgraded by additionally guiding vacuum ultraviolet (VUV) light in a normal-incidence configuration. PMM offers a very powerful tool for comprehensive electronic structure analyses in real and momentum spaces. In this work, a VUV beam with variable polarization in the normal-incidence geometry was obtained at the same sample position as the soft X-ray beam from BL6U by branching the VUV beamline BL7U. The valence electronic structure of the Au(111) surface was measured using horizontal and vertical linearly polarized (s-polarized) light excitations from BL7U in addition to horizontal linearly polarized (p-polarized) light excitations from BL6U. Such highly symmetric photoemission geometry with normal incidence offers direct access to atomic orbital information via photon polarization-dependent transition-matrix-element analysis
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|a Journal Article
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|a atomic orbital
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|a electronic structure
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|a photoelectron momentum microscopy
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|a photoemission spectroscopy
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|a photon polarization
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|a Nakamura, Eiken
|e verfasserin
|4 aut
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|a Makita, Seiji
|e verfasserin
|4 aut
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|a Suga, Shigemasa
|e verfasserin
|4 aut
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|a Tanaka, Shin Ichiro
|e verfasserin
|4 aut
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|a Kera, Satoshi
|e verfasserin
|4 aut
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|a Matsui, Fumihiko
|e verfasserin
|4 aut
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|i Enthalten in
|t Journal of synchrotron radiation
|d 1994
|g 31(2024), Pt 3 vom: 01. Mai, Seite 540-546
|w (DE-627)NLM09824129X
|x 1600-5775
|7 nnns
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|g volume:31
|g year:2024
|g number:Pt 3
|g day:01
|g month:05
|g pages:540-546
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|u http://dx.doi.org/10.1107/S1600577524002406
|3 Volltext
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|d 31
|j 2024
|e Pt 3
|b 01
|c 05
|h 540-546
|