Induced quantum dot probe for material characterization
We propose a non-destructive means of characterizing a semiconductor wafer via measuring parameters of an induced quantum dot on the material system of interest with a separate probe chip that can also house the measurement circuitry. We show that a single wire can create the dot, determine if an el...
| Veröffentlicht in: | Applied physics letters. - 1998. - 114(2019), 15 vom: 22. |
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| Format: | Online-Aufsatz |
| Sprache: | English |
| Veröffentlicht: |
2019
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| Zugriff auf das übergeordnete Werk: | Applied physics letters |
| Schlagworte: | Journal Article |
| Online verfügbar |
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