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240410s2024 xx |||||o 00| ||eng c |
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|a 10.1107/S1600576724000992
|2 doi
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|a pubmed24n1372.xml
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|a eng
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| 100 |
1 |
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|a Berberich, Tim B
|e verfasserin
|4 aut
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| 245 |
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|a A workflow for single-particle structure determination via iterative phasing of rotational invariants in fluctuation X-ray scattering
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|c 2024
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|a Text
|b txt
|2 rdacontent
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|a ƒaComputermedien
|b c
|2 rdamedia
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|a ƒa Online-Ressource
|b cr
|2 rdacarrier
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|a Date Revised 11.04.2024
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|a published: Electronic-eCollection
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|a Citation Status PubMed-not-MEDLINE
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|a © Tim B. Berberich et al. 2024.
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|a Fluctuation X-ray scattering (FXS) offers a complementary approach for nano- and bioparticle imaging with an X-ray free-electron laser (XFEL), by extracting structural information from correlations in scattered XFEL pulses. Here a workflow is presented for single-particle structure determination using FXS. The workflow includes procedures for extracting the rotational invariants from FXS patterns, performing structure reconstructions via iterative phasing of the invariants, and aligning and averaging multiple reconstructions. The reconstruction pipeline is implemented in the open-source software xFrame and its functionality is demonstrated on several simulated structures
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|a Journal Article
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|a X-ray free-electron lasers
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|a fluctuation X-ray scattering
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|a iterative phasing
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| 650 |
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|a single-particle imaging
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| 700 |
1 |
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|a Molodtsov, Serguei L
|e verfasserin
|4 aut
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| 700 |
1 |
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|a Kurta, Ruslan P
|e verfasserin
|4 aut
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| 773 |
0 |
8 |
|i Enthalten in
|t Journal of applied crystallography
|d 1998
|g 57(2024), Pt 2 vom: 01. Apr., Seite 324-343
|w (DE-627)NLM098121561
|x 0021-8898
|7 nnns
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| 773 |
1 |
8 |
|g volume:57
|g year:2024
|g number:Pt 2
|g day:01
|g month:04
|g pages:324-343
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4 |
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|u http://dx.doi.org/10.1107/S1600576724000992
|3 Volltext
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|d 57
|j 2024
|e Pt 2
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|c 04
|h 324-343
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