Nondestructive Single-Atom-Thick Crystallographic Scanner via Sticky-Note-Like van der Waals Assembling-Disassembling

© 2024 The Authors. Advanced Materials published by Wiley‐VCH GmbH.

Bibliographische Detailangaben
Veröffentlicht in:Advanced materials (Deerfield Beach, Fla.). - 1998. - 36(2024), 30 vom: 16. Juli, Seite e2400091
1. Verfasser: Moon, Ji-Yun (VerfasserIn)
Weitere Verfasser: Kim, Seung-Il, Ghods, Soheil, Park, Seungil, Kim, Seunghan, Chang, SooHyun, Jang, Ho-Chan, Choi, Jun-Hui, Kim, Justin S, Bae, Sang-Hoon, Whang, Dongmok, Kim, Tae-Hoon, Lee, Jae-Hyun
Format: Online-Aufsatz
Sprache:English
Veröffentlicht: 2024
Zugriff auf das übergeordnete Werk:Advanced materials (Deerfield Beach, Fla.)
Schlagworte:Journal Article atomic spalling crystallographic graphene nondestructive vdW heterostructure
LEADER 01000caa a22002652c 4500
001 NLM370627423
003 DE-627
005 20250306010618.0
007 cr uuu---uuuuu
008 240405s2024 xx |||||o 00| ||eng c
024 7 |a 10.1002/adma.202400091  |2 doi 
028 5 2 |a pubmed25n1234.xml 
035 |a (DE-627)NLM370627423 
035 |a (NLM)38573312 
040 |a DE-627  |b ger  |c DE-627  |e rakwb 
041 |a eng 
100 1 |a Moon, Ji-Yun  |e verfasserin  |4 aut 
245 1 0 |a Nondestructive Single-Atom-Thick Crystallographic Scanner via Sticky-Note-Like van der Waals Assembling-Disassembling 
264 1 |c 2024 
336 |a Text  |b txt  |2 rdacontent 
337 |a ƒaComputermedien  |b c  |2 rdamedia 
338 |a ƒa Online-Ressource  |b cr  |2 rdacarrier 
500 |a Date Revised 25.07.2024 
500 |a published: Print-Electronic 
500 |a Citation Status PubMed-not-MEDLINE 
520 |a © 2024 The Authors. Advanced Materials published by Wiley‐VCH GmbH. 
520 |a Crystallographic characteristics, including grain boundaries and crystallographic orientation of each grain, are crucial in defining the properties of two-dimensional materials (2DMs). To date, local microstructure analysis of 2DMs, which requires destructive and complex processes, is primarily used to identify unknown 2DM specimens, hindering the subsequent use of characterized samples. Here, a nondestructive large-area 2D crystallographic analytical method through sticky-note-like van der Waals (vdW) assembling-disassembling is presented. By the vdW assembling of veiled polycrystalline graphene (PCG) with a single-atom-thick single-crystalline graphene filter (SCG-filter), detailed crystallographic information of each grain in PCGs is visualized through a 2D Raman signal scan, which relies on the interlayer twist angle. The scanned PCGs are seamlessly separated from the SCG-filter using vdW disassembling, preserving their original condition. The remaining SCG-filter is then reused for additional crystallographic scans of other PCGs. It is believed that the methods can pave the way for advances in the crystallographic analysis of single-atom-thick materials, offering huge implications for the applications of 2DMs 
650 4 |a Journal Article 
650 4 |a atomic spalling 
650 4 |a crystallographic 
650 4 |a graphene 
650 4 |a nondestructive 
650 4 |a vdW heterostructure 
700 1 |a Kim, Seung-Il  |e verfasserin  |4 aut 
700 1 |a Ghods, Soheil  |e verfasserin  |4 aut 
700 1 |a Park, Seungil  |e verfasserin  |4 aut 
700 1 |a Kim, Seunghan  |e verfasserin  |4 aut 
700 1 |a Chang, SooHyun  |e verfasserin  |4 aut 
700 1 |a Jang, Ho-Chan  |e verfasserin  |4 aut 
700 1 |a Choi, Jun-Hui  |e verfasserin  |4 aut 
700 1 |a Kim, Justin S  |e verfasserin  |4 aut 
700 1 |a Bae, Sang-Hoon  |e verfasserin  |4 aut 
700 1 |a Whang, Dongmok  |e verfasserin  |4 aut 
700 1 |a Kim, Tae-Hoon  |e verfasserin  |4 aut 
700 1 |a Lee, Jae-Hyun  |e verfasserin  |4 aut 
773 0 8 |i Enthalten in  |t Advanced materials (Deerfield Beach, Fla.)  |d 1998  |g 36(2024), 30 vom: 16. Juli, Seite e2400091  |w (DE-627)NLM098206397  |x 1521-4095  |7 nnas 
773 1 8 |g volume:36  |g year:2024  |g number:30  |g day:16  |g month:07  |g pages:e2400091 
856 4 0 |u http://dx.doi.org/10.1002/adma.202400091  |3 Volltext 
912 |a GBV_USEFLAG_A 
912 |a SYSFLAG_A 
912 |a GBV_NLM 
912 |a GBV_ILN_350 
951 |a AR 
952 |d 36  |j 2024  |e 30  |b 16  |c 07  |h e2400091