APA Zitierstil

Liu, C., Pan, J., Yuan, Q., Zhu, C., Liu, J., Ge, F., . . . Wang, L. (2024). Highly Reliable Van Der Waals Memory Boosted by a Single 2D Charge Trap Medium. Advanced materials (Deerfield Beach, Fla.), 36(3), . https://doi.org/10.1002/adma.202305580

Chicago Zitierstil

Liu, Chao, et al. "Highly Reliable Van Der Waals Memory Boosted by a Single 2D Charge Trap Medium." Advanced Materials (Deerfield Beach, Fla.) 36, no. 3 (2024). https://dx.doi.org/10.1002/adma.202305580.

MLA Zitierstil

Liu, Chao, et al. "Highly Reliable Van Der Waals Memory Boosted by a Single 2D Charge Trap Medium." Advanced Materials (Deerfield Beach, Fla.), vol. 36, no. 3, 2024.